Publications

Generation and Electrical Contacting of Gold Quantum Dots
G. Schmid, T. Reuter, U. Simon, M. Noyong, K. Blech, V. Santhanam, D. Jäger, H. Slomka, H. Lüth, M. I. Lepsa
Colloid and Polymer Sci. 286, 1029 (2008).

Chemical surface modification via radical C-C bond-forming reactions
K. O. Siegenthaler, A. Schäfer, A. Studer
J. Am. Chem. Soc. 129, 5826 (2007).

Mapping the tip–sample interactions on DPPC and DNA by dynamic force spectroscopy under ambient conditions
J.-E. Schmutz, H. Hölscher, D. Ebeling, M. M. Schäfer, B. Anczykowski
Ultramicroscopy 107, 875 (2007).

Scanning ion conductance microscopy with distance-modulated shear force control
M. Böcker, B. Anczykowski, J. Wegener, T. E. Schäffer
Nanotechnology 18, 145505 (2007).

Fast element mapping of titanium wear around implants of different surface structures
U. Meyer, M. Bühner, A. Büchter, B. Kruse-Lösler, T. Stamm, H. P. Wiesmann
Clin. Oral Impl. Res. 17, 206 (2006).

Increasing the Q factor in the constant-excitation mode of frequency-modulation atomic force microscopy in liquid
D. Ebeling, H. Hölscher, B. Anczykowski
Appl. Phys. Lett. 89, 203511 (2006).

Imaging of biomaterials in liquids - a comparison between conventional and Q-controlled amplitude modulation ('tapping mode') atomic force microscopy
D. Ebeling, H. Hölscher, H. Fuchs, B. Anczykowski, U. D. Schwarz
Nanotechnology 17, S221 (2006).

Generation and Characterization of Multilayered Systems Consisting of Au₅₅(PPh₃)₁₂Cl₆ Double Layers and SiO₂ Barrier Films
T. Reuter, S. Neumeier, G. Schmid, E. Koplin, U. Simon
Eur. J. Inorg. Chem. 18, 3670 (2005).

The Electronic Interaction Between Au₅₅(PPh₃)₁₂Cl₆ Monolayers Through SiO₂ Films
S. Neumeier, T. Reuter, G. Schmid
Eur. J. Inorg. Chem. 18, 3679 (2005).

Quantitative measurement of tip–sample forces by dynamic force spectroscopy in ambient conditions
H. Hölscher, B. Anczykowski
Surf. Sci. 579, 21 (2005).

Dynamic force spectroscopy using the constant-excitation and constant-amplitude modes
A. Schirmeisen, H. Hölscher, B. Anczykowski, D. Weiner, M. M. Schäfer, H. Fuchs
Nanotechnology 16, S13 (2005).

Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams
Ch. Lehrer, L. Frey, M. Schäfer, T. Sulzbach, S. Petersen, H. Ryssel
J. Vac. Sci. Tech. B 22, 1402 (2004).

Influence of titanium surfaces on attachment of osteoblast-like cells in vitro
M. Jayaraman, U. Meyer, M. Bühner, U. Joos, H. P. Wiesmann
Biomaterials 25, 625 (2004).

Two-dimensional networks via quasi one-dimensional arrangements of gold clusters
T. Reuter, O. Vidoni, V. Torma, G. Schmid G., N. Lu, M. Gleiche, L.F. Chi, H. Fuchs
Nano Lett. 2, 709 (2002).

Connecting nanowires consisting of Au-55 with model electrodes
N. Lu, J.W. Zheng, M. Gleiche, H. Fuchs, L.F. Chi, O. Vidoni, T. Reuter, G. Schmid
Nano Lett. 2, 1097 (2002).

Dynamic scanning force microscopy study of self-assembled DNA-protein nanostructures
B. Pignataro, L. F. Chi, S. Gao, B. Anczykowski, C. Niemeyer, M. Adler, H. Fuchs
Appl. Phys. A 74, 447 (2002).

The supression of water-diffusion in polycarbonate through Ar and He plasma as a new model for the origin of improved adhesion of Al
M. M. Schäfer, C. Seidel, H. Fuchs, M. Voetz
Appl. Surf. Sci. 173, 1 (2001).

The diode behavior of asymmetrically ordered Au-55 clusters
V. Torma, T. Reuter, O. Vidoni, M. Schumann, C. Radehaus, G. Schmid
ChemPhysChem 2, 546 (2001).

Quasi one-dimensional gold cluster arrangements
O. Vidoni, T. Reuter, V. Torma, W. Meyer-Zaika, G. Schmid
J. Mater. Chem. 11, 3188 (2001).

LEED and optical spectroscopy study of an organic epitaxial multilayer film
A. Schäfer, C. Seidel, H. Fuchs
Adv. Funct. Mater. 11, 193 (2001).

Comparison of atomic force microscopy and transmission electron microscopy of second-phase particles
U. Lagerpusch, B. Anczykowski, E. Nembach
Phil. Mag. A 81, 2613 (2001).

High-quality mapping of DNA-protein complexes by dynamic scanning force microscopy
S. Gao, L. F. Chi, S. Lenhert, B. Anczykowski, C. Niemeyer, M. Adler, H. Fuchs
ChemPhysChem 6, 384 (2001).

The effect of annealing on the photoluminescence of epitaxial DMe-PTCDI multilayers on Ag(110)
A. Schäfer, C. Seidel, H. Fuchs
Thin Solid Films 379, 176 (2000).

The influence of molecular aggregation on the device properties of organic light emitting diodes
P. Schouwink, A. Schäfer, C. Seidel, H. Fuchs
Thin Solid Films 372, 163 (2000).

Double strengthening of copper by dissolved gold-atoms and by incoherent SiO₂-particles: how do the two strengthening contributions superimpose?
U. Lagerpusch, V. Mohles, D. Baither, B. Anczykowski, E. Nembach
Acta Mater. 48, 3647 (2000).

Oriented growth of DMe-PTCDI on Ag(110); an LEED, XPS, SFM and STM characterisation
C. Seidel, A. Schäfer, H. Fuchs
Surf. Sci. 459, 310 (2000).

Supermolecular periodic structures in monolayers
L. F. Chi, S. Jacobi, B. Anczykowski, M. Overs, H.-J. Schäfer, H. Fuchs
Adv. Mater. 12, 25 (2000).

Conservative and dissipative tip-sample interaction forces probed with dynamic AFM
B. Gotsmann, C. Seidel, B. Anczykowski, H. Fuchs
Phys. Rev. B 60, 11051 (1999).

How to measure energy dissipation in dynamic mode atomic force microscopy
B. Anczykowski, B. Gotsmann, H. Fuchs, J. P. Cleveland, V. B. Elings
Appl. Surf. Sci. 140, 376 (1999).

Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves and computer simulation
B. Gotsmann, B. Anczykowski, C. Seidel, H. Fuchs
Appl. Surf. Sci. 140, 314 (1999).

STM investigations of thiol self-assembled monolayers
A. Schäfer, C. Seidel, L. F. Chi, H. Fuchs
Adv. Mater. 10, 839 (1998).

Energy dissipation in tapping-mode atomic force microscopy
J. P. Cleveland, B. Anczykowski, A. E. Schmid, V. B. Elings
Appl. Phys. Lett. 72, 2613 (1998).

Analysis of the interaction mechanisms in dynamic mode SFM by means of experimental data and computer simulation
B. Anczykowski, J. P. Cleveland, D. Krüger, V. B. Elings, H. Fuchs
Appl. Phys. A 66, S885 (1998).

Physical properties of dynamic force microscopies in contact and noncontact operation
D. Krüger, B. Anczykowski, H. Fuchs
Ann. Phys. 6, 341 (1997).

Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation
B. Anczykowski, D. Krüger, K. L. Babcock, H. Fuchs
Ultramicroscopy 66, 251 (1996).

Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects
B. Anczykowski, D. Krüger, H. Fuchs
Phys. Rev. B 53, 15485 (1996).

An amperometric microsensor array with 1024 individually addressable ele-ments für 2-dimensional concentration mapping
H. Hinkers, T. Hermes, C. Sundermeier, M. Borchardt, C. Dumschat, S. Bucher, M. Bühner, K. Camann, M. Knoll
Sens. Act. B Chem. 24, 300 (1995).

Atomic force microscopy investigations on polymer latex films
B. Anczykowski, L. F. Chi, H. Fuchs
Surf. Interface Anal. 23, 416 (1995).

An amperometric microsensor array with 1024 individually addressable ele-ments für 2-dimensional concentration mapping
T. Hermes, M. Bühner, S. Bücher, C. Sundermeier, C. Dumschat, M. Borchardt, K. Cammann, M. Knoll
Sens. Act. B Chem. 21, 33 (1994).

Sm-Ba-Cu-O films grown at low temperature and pressure
H. M. Appelboom, V. C. Matijasevic, F. Mathu, G. Rietveld, B. Anczykowski, W. J. A. M. Peterse, F. Tuinstra, J. E. Mooij, W. G. Sloof, H. A. Rijken, S. S. Klein, L. J. van IJzendoorn
Physica C 214, 323 (1993).

Shear-Force-Controlled Scanning Ion Conductance Microscopy
T. E. Schäffer, B. Anczykowski, M. Böcker, H. Fuchs
in Nanobiotechnology II: More Concepts and Applications; Chapter 11, pp. 197-212
C. A. Mirkin, C. M. Niemeyer (Eds.)
Wiley-VCH Verlag Weinheim 2007
ISBN 3-527-31673-6

Dynamic Modes of Atomic Force Microscopy
A. Schirmeisen, B. Anczykowski, H. Fuchs
in Springer Handbook of Nanotechnology, 2nd Edition; Chapter 27, pp. 737-765
B. Bushan (Ed.)
Springer Verlag Berlin Heidelberg 2007
ISBN 978-3-540-35172-6.

Scanning Ion Conductance Microscopy
T. E. Schäffer, B. Anczykowski, H. Fuchs
in Applied Scanning Probe Methods II; Chpater 3, pp. 91-119
B. Bushan, H. Fuchs (Eds.)
Springer Verlag Berlin Heidelberg 2006
ISBN 3-540-26242-3.

Dynamic Force Microscopy
A. Schirmeisen, B. Anczykowski, H. Fuchs
in Nanotribology and Nanomechanics; Chapter 6, pp. 243-281
B. Bushan (Ed.)
Springer Verlag Berlin Heidelberg 2005
ISBN 3-540-24267-8.

Dynamic Force Microscopy
A. Schirmeisen, B. Anczykowski, H. Fuchs
in Applied Scanning Probe Methods I; Chapter 1, pp. 340
B. Bushan, H. Fuchs, S. Hosaka (Eds.)
Springer Verlag Berlin Heidelberg 2004
ISBN 3-540-00527-7.

Dynamic Force Microscopy
A. Schirmeisen, B. Anczykowski, H. Fuchs
in Springer Handbook of Nanotechnology; Chapter 15, pp. 449-473
B. Bushan (Ed.)
Springer Verlag Berlin Heidelberg 2004
ISBN 3540012184.

Mikroelektronisches Bauelement
G. Schmid, D. Jäger, V. Santhanam, U. Simon, T. Reuter
EP 1748501, 17.10.2007.

Application of nanoanalytical techniques to industrial problems
A. Schäfer
NanoS Guide, Wiley-VCH Verlag Weinheim 2006.

Nanoanalytik, Nanotools

A. Schäfer, M. Bühner, H. Fuchs
MSTI Fernlehrgang Nanotechnologie – Modul 10
IIR Verlag Frankfurt 2006.

Schichtanalytik mit dem Rasterelektronenmikroskop
M. Bühner
VDI Ingenieurforum Westfalen 2005.

Analytik in der industriellen Praxis der Oberflächentechnik
A. Schäfer
Synergie Journal 2002.

Nanoanalytik in der Oberflächentechnik
A. Schäfer
VDI Ingenieurforum Westfalen 2001.

Rasterkraftmikroskopie - Tastend durch die Nanowelt
B. Anczykowski, L. F. Chi, H. Fuchs, B. Gotsmann
Spektrum der Wissenschaft 1999.