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  • Start
  • Services
    • Overview
    • Analytical Techniques
      • Scanning Electron Microscopy (SEM)
      • Energy Dispersive X-Ray Spectroscopy (EDS)
      • X-Ray Photoelectron Spectroscopy (XPS-ESCA)
      • Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
      • Infrared Spectroscopy (FTIR)
      • Optical Profilometry (OP)
      • Atomic Force Microscopy (AFM)
      • Contact Angle Measurement
    • Sample Preparation
    • Fields of Application
      • Adhesion & Bonding
      • Cleanliness & Residues
      • Material Composition
      • Corrosion & Material Degradation
      • Depth Profiling & Diffusion
      • Failure Analysis
      • Surface Analysis
      • Morphology & Topography
      • Surface Chemistry
      • Thin Films and Coatings
    • Laboratory Comparison
    • FAQ
  • Products
    • cellZscope
      • cellZscopeE
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      • cellZscope2
      • cellZscope3
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To find out more about some specific application solutions please choose one of the links below.
For further information please contact us.

  • Adhesion & Bonding
  • Cleanliness & Residues
  • Material Composition
  • Corrosion & Material Degradation
  • Depth Profiling & Diffusion
  • Failure Analysis
  • Surface Analysis
  • Morphology & Topography
  • Surface Chemistry
  • Thin Films and Coatings

Any questions? Please contact us.

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