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  • Start
  • Services
    • Overview
    • Analytical Techniques
      • Scanning Electron Microscopy (SEM)
      • Energy Dispersive X-Ray Spectroscopy (EDS)
      • X-Ray Photoelectron Spectroscopy (XPS-ESCA)
      • Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
      • Infrared Spectroscopy (FTIR)
      • Optical Profilometry (OP)
      • Atomic Force Microscopy (AFM)
      • Contact Angle Measurement
    • Sample Preparation
    • Fields of Application
      • Adhesion & Bonding
      • Cleanliness & Residues
      • Material Composition
      • Corrosion & Material Degradation
      • Depth Profiling & Diffusion
      • Failure Analysis
      • Surface Analysis
      • Morphology & Topography
      • Surface Chemistry
      • Thin Films and Coatings
    • Accreditation
    • Laboratory Comparison
      • Registration
      • Submit Results
    • FAQ
  • Products
    • cellZscope
      • cellZscopeE
      • cellZscope+
      • cellZscope2
      • cellZscope3
      • Software
      • Compatible Cell Culture Inserts
      • How it Works
      • Applications
        • Ap1 - From Short-Term To Long-Term
        • Ap2 - MDCK Cell Layer treated with MBCD
        • Ap3 - Compound Mediated Effects
        • Ap4 - cellZscope vs Chopstick
        • Ap5 - MDCK-I Cell Layer treated with Saponin
      • Publications
      • Distributors
      • Newsletter
    • Consumables
      • cellQART
  • Company
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